HUAN-YI LIN is an IP Director at TPK Touch Solutions in Taipei.  Mr. Lin graduated from University of Pennsylvania Law School in 1999 and was admitted to California Bar in 2002.  He is also an S.J.D. candidate at The George Washington University Law School.  Mr. Lin previously interned with Chief Judge Randall R. Rader of the U.S. Court of Appeals for the Federal Circuit.  Before joining TPK, Mr. Lin worked with leading US and Taiwan law firms for more than 12 years focusing on patent litigation in district courts and ITC, patent prosecution, consultation, and licensing in various technical fields including circuit design, semiconductor manufacturing, flat display, wireless/portable devices, telecommunication, and computer hardware/software.  In addition, he has been invited to conduct comparative research on patent law issues as a visiting scholar at the University of Tokyo, the Institute of Intellectual Property in Tokyo, and the Max Planck Institute for Intellectual Property in Munich.

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